Photolithography stepper lens performing precision patterning on an AQ-grade quartz photomask substrate

Photolithography

Photomask Substrates (AQ Grade)

High-purity AQ-grade synthetic quartz photomask substrates with sub-100nm flatness and low defect counts for advanced photolithography.

AQ-grade synthetic quartz photomask substrates engineered to the requirements of leading photomask manufacturers. These are also offered as photomask blanks for downstream coating and patterning. Two characteristics dominate the qualification list:

  • Flatness below 100nm per side. Essential for sub-resolution lithography where any departure from perfect flatness translates directly to focus error.
  • Low defect counts. Minimized scratches, pits, and inclusions across the substrate surface.

The base material is the same AQ synthetic fused quartz used across the photolithography product family, with surface polishing and flatness control optimized for the photomask application.

Applications

  • Photomasks for ArF, KrF, and i-line photolithography
  • Photomask blanks for next-generation lithography

Documents

Documents available on request. Use the form below.

Specifications

Photomask Substrates specifications

Chemical constitution
100wt% SiO₂
CTE (50–200°C)
0.6ppm/K
Softening point
1,600°C
Annealing point
1,120°C
Strain point
1,060°C
Refractive index (n_D)
1.46
Acid resistance
0.000mg/cm²
Alkali resistance
0.032mg/cm²
Density
2.20g/cm³
Young's modulus
74GPa
Knoop micro hardness
540kg/mm²
Bulk resistivity (200°C)
12.5log Ω·cm
Dielectric constant (1 MHz, R.T.)
4.0 Typical data, not guaranteed

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